The evolving technology of augmented reality (AR) and virtual reality (VR) devices, accelerated
by spatial computing, has introduced new challenges for display metrology. To simultaneously
satisfy measuring small form-factor near-eye displays with a wide field of view is particularly
challenging. Given the market demands, a single metrology for both AR and VR products
represents a worthy problem to solve. AR production flows involving waveguide testing require
compact test-optics. VR production flows involving pancake lens testing require wide field of view.
A prior study introduced and evaluated the suitability of two instrumentation approaches for
testing within the eyebox: 1) combining a camera system with a spectroradiometer via beamsplitter
and 2) point-scanning the field of view with fast scanning mirrors and spectroradiometer [1]. These
instruments measure resolution (MTF), tristimulus color (XYZ), and luminance (Y).<\/p>\n","protected":false},"excerpt":{"rendered":"
The evolving technology of augmented reality (AR) and virtual reality (VR) devices, acceleratedby spatial computing, has introduced new challenges for display metrology. To simultaneouslysatisfy measuring small form-factor near-eye displays with a wide field of view is particularlychallenging. Given the market demands, a single metrology for both AR and VR productsrepresents a worthy problem to solve. […]<\/p>\n","protected":false},"author":365,"featured_media":6531,"template":"","meta":{"_acf_changed":true,"show_table_of_content":true},"class_list":["post-6530","novanta_tech_paper","type-novanta_tech_paper","status-publish","has-post-thumbnail","hentry"],"acf":[],"yoast_head":"\n