Wide gamut laser displays, microLED, and OLED technologies demand high spectral accuracy and low measurement uncertainty, making robust calibration essential for reliable metrology. This study evaluates the reproducibility of a four-line laser diode wavelength calibration method for spectroradiometers using Gage Repeatability and Reproducibility (Gage R&R) analysis. Measurements were performed on three qualified spectroradiometers using a known spectral line from a mercury (Hg) lamp. The results show negligible operator influence and low repeatability error, with an expanded uncertainty below ± 0.1 nm. The method demonstrates strong reproducibility and sensitivity to systematic errors, making it suitable for production environments and instrument diagnostics.
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