The evolving technology of augmented reality (AR) and virtual reality (VR) devices, accelerated
by spatial computing, has introduced new challenges for display metrology. To simultaneously
satisfy measuring small form-factor near-eye displays with a wide field of view is particularly
challenging. Given the market demands, a single metrology for both AR and VR products
represents a worthy problem to solve. AR production flows involving waveguide testing require
compact test-optics. VR production flows involving pancake lens testing require wide field of view.
A prior study introduced and evaluated the suitability of two instrumentation approaches for
testing within the eyebox: 1) combining a camera system with a spectroradiometer via beamsplitter
and 2) point-scanning the field of view with fast scanning mirrors and spectroradiometer [1]. These
instruments measure resolution (MTF), tristimulus color (XYZ), and luminance (Y).
technical papers
White Paper: Modular Spectroradiometer Accessories for AR/VR Near-Eye Metrology
Published on June 5, 2026
The evolving technology of augmented reality (AR) and virtual reality (VR) devices, acceleratedby spatial computing, has introduced new challenges for display metrology. To simultaneouslysatisfy measuring small form-factor near-eye displays with a wide field of view is particularlychallenging. Given the market demands, a single metrology for both AR and VR productsrepresents a worthy problem to solve.…
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